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Manual Prober
(for 6-inch wafer/8-inch wafer)

Features

Model 705C
Model MP-10C

Manual Prober for 6-inch wafer / 8-inch wafer

This series offers general-purpose manual probers for a variety of different types of evaluation and analysis.
These models can also be used for evaluation of temperature characteristics and high-voltage devices.

Easy operation

  • 01Air bearing stage for easy one-handed operation

    Allows stage positioning within a short time, which improves measurement efficiency.

Safety design

  • 01Safety lock mechanism to prevent damage to devices and probes caused by improper contact operation

    Reduces wasteful remaking of devices, remeasurement, and probe maintenance.

Customizable

  • Customizable according to the intended use, for example, with addition of probe card adapter, hot chuck (+40℃ to +300℃), microscope, or laser cutter system, or into a prober able to withstand high voltages.

Specifications: Manual Prober Model 705C (for 6-inch wafer)

Maximum wafer size φ150mm
Stage travel
(rough adjustment)
X: 180mm Y: 220mm
Sub-stage travel
(fine adjustment)
X: 10mm Y: 10mm
Z stroke 0 / 0.3 / 3.5mm+37.5mm
Θ travel ±90°
External dimensions
(WxDxH)
440mm×580mm×290mm (excluding options)
System weight 50kg (excluding options)

Specifications: Manual Prober Model MP-10C (for 8-inch wafer)

Maximum wafer size φ200mm
Stage travel
(rough adjustment)
X: 220mm Y: 270mm
Sub-stage travel
(fine adjustment)
X: 10mm Y: 10mm
Z stroke 0 / 0.3 / 3.5mm+37.5mm
Θ travel Rough adjustment: ±25°
Fine adjustment: ±5°
External dimensions
(WxDxH)
560mm×761mm×346mm (excluding options)
System weight 70kg (excluding options)

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