Manual Prober
(for 6-inch wafer/8-inch wafer)
Features
Model 705C
Model MP-10C
Manual Prober for 6-inch wafer / 8-inch wafer
This series offers general-purpose manual probers for a variety of different types of evaluation and analysis.
These models can also be used for evaluation of temperature characteristics and high-voltage devices.
Easy operation
-
01Air bearing stage for easy one-handed operation
Allows stage positioning within a short time, which improves measurement efficiency.
Safety design
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01Safety lock mechanism to prevent damage to devices and probes caused by improper contact operation
Reduces wasteful remaking of devices, remeasurement, and probe maintenance.
Customizable
- Customizable according to the intended use, for example, with addition of probe card adapter, hot chuck (+40℃ to +300℃), microscope, or laser cutter system, or into a prober able to withstand high voltages.
Specifications: Manual Prober Model 705C (for 6-inch wafer)
Maximum wafer size | φ150mm |
---|---|
Stage travel (rough adjustment) |
X: 180mm Y: 220mm |
Sub-stage travel (fine adjustment) |
X: 10mm Y: 10mm |
Z stroke | 0 / 0.3 / 3.5mm+37.5mm |
Θ travel | ±90° |
External dimensions (WxDxH) |
440mm×580mm×290mm (excluding options) |
System weight | 50kg (excluding options) |
Specifications: Manual Prober Model MP-10C (for 8-inch wafer)
Maximum wafer size | φ200mm |
---|---|
Stage travel (rough adjustment) |
X: 220mm Y: 270mm |
Sub-stage travel (fine adjustment) |
X: 10mm Y: 10mm |
Z stroke | 0 / 0.3 / 3.5mm+37.5mm |
Θ travel | Rough adjustment: ±25° Fine adjustment: ±5° |
External dimensions (WxDxH) |
560mm×761mm×346mm (excluding options) |
System weight | 70kg (excluding options) |
List of Wafer Prober Products
-
Semi-Automatic Prober
(for 8-inch wafer Low Current Measurement) -
Manual Prober
(for 8-inch wafer Low Current Measurement) -
Manual Prober
(for 6-inch wafer/8-inch wafer) -
Manual Prober
(for 12-inch wafer) -
Personal Manual Prober
(for 2-inch wafer/4-inch wafer)