(for 12-inch wafer)
Manual Prober for 12-inch wafer
Manual prober for analyses of wafers up to 12 inches
01Air bearing stage for easy one-handed operation
Allows stage positioning within a short time, which improves measurement efficiency.
Wide contact area
01Slide table for securing wide probing area
Eliminates the need to reposition the device under measurement, which improves evaluation efficiency.
01Safety lock mechanism to prevent damage to devices and probes caused by improper contact operation
Reduces wasteful remaking of devices, remeasurement, and probe maintenance.
- Customizable according to the intended use, for example, with addition of microscope or laser cutter
Specifications: Manual Prober Model 705A-WG7(for 12-inch wafer)
|Maximum wafer size
|X: 500mm Y: 400mm
|X: 25mm Y: 25mm
|0 / 0.3 / 3.5mm+37.5mm
|Rough adjustment: ±45°
Fine adjustment: ±5°
|978mm×1,038mm×748mm (excluding options)
|130kg (excluding options)
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