(For 8-inch wafer Low Current Measurement)
Manual Prober for 8-inch wafer
Manual prober model capable of measuring fA-level low current
Low current measurement
01The three-layer structure with guard and shield allows measurement of fA-level low current
02Despite the simple structure, this model allows low-noise, high-accuracy measurement
01Air bearing stage for easy one-handed operation
Allows stage positioning within a short time, which improves measurement efficiency.
01Safety lock mechanism to prevent damage to devices and probes caused by improper contact operation
Reduces wasteful remaking of devices, remeasurement, and probe maintenance.
Various customization options available
- Can be equipped with hot chuck (+40℃ to +200℃) for evaluation of temperature-dependent properties
- Customizable according to intended use
Specifications: Model 708fT Manual Prober (for 8-inch wafer Low Current Measurement)
|Maximum wafer size
|X: 220mm Y：270mm
|X: 10mm Y: 10mm
|0 / 0.3 / 3.5mm+3mm
|897mm×863mm×400mm (excluding options)
|120kg (excluding options)
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Accessories / Options and Maintenance Parts
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