Manual Prober
(For 8-inch wafer Low Current Measurement)
Features
Model 708fT
Manual Prober for 8-inch wafer
Manual prober model capable of measuring fA-level low current
Low current measurement
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01The three-layer structure with guard and shield allows measurement of fA-level low current
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02Despite the simple structure, this model allows low-noise, high-accuracy measurement
Easy operation
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01Air bearing stage for easy one-handed operation
Allows stage positioning within a short time, which improves measurement efficiency.
Safety design
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01Safety lock mechanism to prevent damage to devices and probes caused by improper contact operation
Reduces wasteful remaking of devices, remeasurement, and probe maintenance.
Various customization options available
- Can be equipped with hot chuck (+40℃ to +200℃) for evaluation of temperature-dependent properties
- Customizable according to intended use
Specifications: Model 708fT Manual Prober (for 8-inch wafer Low Current Measurement)
| Maximum wafer size | φ200mm |
|---|---|
| Stage travel (rough adjustment) |
X: 220mm Y：270mm |
| Sub-stage travel (fine adjustment) |
X: 10mm Y: 10mm |
| Z stroke | 0 / 0.3 / 3.5mm+3mm |
| Θ travel | ±5° |
| External dimensions (WxDxH) |
897mm×863mm×400mm (excluding options) |
| System weight | 120kg (excluding options) |
List of Wafer Prober Products
-
Semi-Automatic Prober
(for 8-inch wafer Low Current Measurement) -
Manual Prober
(for 8-inch wafer Low Current Measurement) -
Manual Prober
(for 6-inch wafer/8-inch wafer) -
Manual Prober
(for 12-inch wafer) -
Personal Manual Prober
(for 2-inch wafer/4-inch wafer)
