SP-Probe
Features
![](https://www.mjc.co.jp/wp-content/themes/adop-mjc/img/products/SP-Probe_image.jpg)
SP-Probe
SP-Probe refers to vertical-spring-type probe cards.
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01Best suited to one-touchdown testing of 12-inch wafers (NAND Flash) and WLCSP applications
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02High needle pressure specification ensures reliable and stable contact with the pad under the oxide layer
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03Single pin replacement for ease of maintenance