Date
March 26 -28 (Wednesday – Friday) 2025
Venue
SNIEC, Shanghai, China
Exhibits
Probe Card
-U-Probe for DRAM / Cantilever
-MEMS-SP for flip chip / MEMS-V for Logic Devices
Package Probe (Test Sockets)
Booth No
T3169
Official Website
SEMICON China 2025 Official Website
