What is a probe unit?

A probe unit is a testing instrument to be mounted on a prober to contact the panel to transmit electrical signals for FPD testing. Probe unit types vary according to the purpose of the test, size of the panel, resolution, and other requirements.

A probe unit consists of a probe block, which contacts the FPD, and a probe base, which supports the probe block and serves as a mechanical interface to the prober (see the figure below). The probe block, which is an aggregate of fine electrical contacts (probes), contacts the FPD's driver IC contact pad to transmit electrical signals for driving the panel or testing electrical characteristics.

MJC provides the following three types of probes.
Each type can be customized according to panel size, resolution, or other design requirements.

Blade type The blade type has a structure in which thin plate blades are arranged within slits. This type allows single pin replacement for easy maintenance of the blades and features superior durability.
Film type Film-type probes using photolithography technology allow highly accurate and customizable probe arrangement and are used for panels with fine pitch or special pad arrangements (e.g., COG panel).
Needle type The needle type's structure has mold-fixed cantilever probes. This type is used as a probe for TEG testing in the array test process and for low-temperature polycrystalline silicon TFT.
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