What is a BIST/DFT tester?

A BIST/DFT tester is a tester that allows efficient testing of semiconductor LSI chips that have built-in self-test (BIST) circuits.

What is BIST?

BIST is one of the designs for testability (DFT) technologies. Building a circuit for generating a test pattern as a part of tester function and a circuit for comparing test results and expected values in an LSI chip makes it possible to conduct testing within the chip’s circuits. BIST circuits include memory BIST for memory testing and logic BIST for logic circuit testing.

Advantage of BIST

The biggest advantage of introducing BIST is test cost reduction. Since there is no need to supply most of the test patterns from an LSI tester, it is possible to conduct testing with fewer test pins per chip, which enables an increase in the number of chips that can be tested at one time. That eliminates the need for a high-performance tester and helps reduce investment in a tester and probe card. Another advantage is the generation of high speed test signals within an LSI, which allows testing at the speed of actual operation.


MJC provides testers for BIST/DFT, allowing the best hardware configurations according to the specifications of memory BIST, logic BIST, etc., suitable for the continuity test, AC parametric test, DC parametric test, and function test. Optimization design to meet customer needs helps achieve a high pin count, compact size, and low cost.