Semiconductor Test Equipment (IC Tester)
Contributing to test cost reduction with optimized solutions to meet needs
|Model||μTAT5100 Series||μTAT5300 Series|
|Number of pins||256–512 pins||256–4,096 pins||64–512 pins||64–2,048 pins|
Per-pin, high-speed logic tester
Per-pin architecture with a tremendous degree of freedom for testing
- Test conditions can be set per pin, which contributes to test cycle time reduction.
Equipped with direct interface of Standard Test Interface Language (STIL)
- Can shorten the test program development period.
Addition of memory test is optional
|Maximum number of pins||2,048 pins|
Achieving high cost efficiency of test systems with sufficient essential functions and performance
We will develop custom testers and test systems with selected functions to suit the test environment or budget.
- Developing custom test systems combining a basic tester platform with customized circuit substrates
- Building test solutions for various type of devices or by adding software to meet needs
- Memory test, analog test
- Application software
- Device measurement program
- Pin electronics substrate