Automated Optical Inspection (AOI) / Mura Inspection and Compensation Solution

Inspection solutions for panel yield improvement and cost-cutting

MJC provides test solutions that contribute to panel yield enhancement and cost-cutting.
Automated optical inspection (AOI) equipment devices optically detect dot defects, line defects, and uneven brightness (mura) in the FPD cell/module process. AOI equipment allows quantitative inspection to replace conventional visual inspection, therefore eliminating subjective assessment by an operator. With labor saving and quantification, it also contributes to test cost reduction, stable quality, and yield improvement.
Mura inspection and compensation systems eliminate mura with compensation for lighting control, therefore making defective panels non-defective. They also contribute to improvement in yield and quality (grade), as well as to cost-cutting through optimization of parts.

Automated Optical Inspection (AOI) Equipment

PIXQUIRE

Saves labor and achieves quantification of testing

Cell/Module Tester for Large Panel

This tester is suitable for testing larger panels up to 110 inches.

Features

Suitable for super high-resolution 8K4K panel

  • This tester can be used well into the future, making it a worthy investment.

Allows automated detection of dot defects, line defects, and mura (uneven brightness) using a CCD camera, as well as address identification

  • Can reduce test cost through reducing labor and quantification.
  • Improves yield with repairing.

Achieves full-automation of inspection when connected to your existing cell prober

  • Reduces initial investment and contributes to improved productivity.

Cell/Module Tester for Small- and Medium-Sized Panels

This is an all-in-one tester integrating a prober, and is suitable for small- and medium-sized panels of tablets and in-car devices.

Features

Allows simultaneous inspection of multiple panels

  • Its high throughput will improve productivity.

Allows automated detection of dot defects, line defects, and uneven brightness (mura) using a CCD camera, as well as address identification

  • Can reduce test cost through reducing labor and quantification.
  • Improves yield with repairing.

Allows diverse module-specific inspections of cross-talk, flicker, afterimage, etc.

  • Prevents defective products from continuing on to the next process, which contributes to cost reduction.

Mura Inspection and Compensation System

Gaterumph

Contributes to yield and quality improvement as well as cost-cutting

Gaterumph automatically inspects and compensates mura or unevenness in LCD and OLED (organic EL display) lighting.
This system is suitable for a wide variety of panels, from small- and medium-sized panels to large panels.

Features

Automated optical inspection and compensation of mura caused by materials or manufacturing processes

  • Makes defective panels non-defective, which improves yield
  • Can improve panel quality (grade)

Can compensate for mura caused by parts, which tends to occur when low-cost parts are used

  • Expands your choice of parts, which may lead to further cost-cutting.

Allows go/no-go testing after mura compensation

  • Eliminates the need to retest lighting, which contributes to test cost reduction.

Note: MJC developed this system jointly with IIX Inc.

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