Events

Date	Name of exhibition	Venue
December 14-16	SEMICON Japan 2022	Tokyo Big Sight, Japan
September 14-16	SEMICON TAIWAN 2022	Taipei Nangang Exhibition Center, Taiwan
June 5-8	Semiconductor Wafer Test Conference (SWTest) 2022	Omni La Costa Hotel in Carlsbad, California, U.S.A.

Date	Name of exhibition	Venue	Products on display
December 28-30	SEMICON TAIWAN 2021	Taipei, Taiwan	Advanced Probe Card; MEMS-SP for Flip Chip / Vertical-Probe (Needle Type) / U-Probe for DRAM Package Probe (Test Sockets) Custom Tester Wafer Prober
December 15-17	SEMICON Japan 2021 Hybrid	Tokyo, Japan	Advanced Probe Card; MEMS-SP for Flip Chip / Vertical-Probe (Needle Type) / U-Probe for DRAM Package Probe (Test Sockets); J-Contacts / BeeContacts Custom Tester Wafer Prober
August 30-September 1	Semiconductor Wafer Test Conference (SWTEST) 2021	California, U.S.A	Advanced Probe Card; MEMS-SP for Flip Chip / Probe Card for Logic Devices / U-Probe for DRAM
August 23-27	SEMICON Southeast Asia 2021	Online	Package Probe (Test Sockets); J-Contacts
May 3-7	TestConX 2021	Online	Package Probe (Test Sockets); J-Contacts

Date	Name of exhibition	Venue	Products on display
December 14-17	SEMICON JAPAN VIRTUAL	Online	Advanced Probe Card; MEMS-SP for Flip Chip / Vertical-Probe (Needle Type) / U-Probe for DRAM Package Probe (Test Sockets); J-Contacts / BeeContacts Custom Tester Wafer Prober
November 11	SWTEST UNTETHERED 2020	Online	Advanced Probe Card; MEMS-SP for flip chip / Probe Card for Logic Devices / U-Probe for DRAM
September 23-25	SEMICON TAIWAN 2020	Taipei	Advanced Probe Card; MEMS-SP for flip chip / Vertical-Probe (Needle Type) / U-Probe for DRAM Cantilever Type Probe Card; for Small Scrub Marks / LCD-Driver Package Probe (Test Sockets) Custom Tester Wafer Prober

Event Calendar