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Event Calender

Japanese Event in 2013

Exhibition Date Venue Exhibits
Held inside NEPCON JAPAN 2013
30th ELECTROTEST JAPAN		 Jan.16-18
Closed.		 Tokyo Big Sight(East Hall), Japan Package Probe(Test Socket);
 BeeContacts
 J-Contacts
 J-Contacts K-Series
 J-Contacts NF-Series
Probing Test System;
 "e5-System"
Tester
 EngineeringTester "μTAT5300-ES"
Held inside FINETECH JAPAN
TOUCH PANEL JAPAN		 Apr.10-12
Closed.		 Tokyo Big Sight, Japan Automatically Appearance Inspection System for Touch Panel
Mura Solution System
Open Repair System
Touch Panel Prober
Compact Coater for Reserch

International Event in 2013

Exhibition Date Venue Exhibits
BiTS EXPO 2013
(Burn-in & Test Strategies Workshop)		 Mar.3-6
Closed.		 Hilton Phoenix East/Mesa Hotel, AZ, USA Package Probe(Test Socket):
 BeeContacts
 J-Contacts NF-Series
 J-Contacts K-Series
Probe Card:
 Probe Card for WLCSP
IEEE Semiconductor Wafer Test Workshop (SWTW) 2013 Jun.9-12
Closed.		 Rancho Bernardo Inn, San Diego, USA Advanced Probe Cards;
U-Probe "Crescent"/Vertical-Probe(Needle Type)/Probe Card for WLCSP
Package Probe;
J-Contacts/BeeContacts

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