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No corporate events are scheduled.
Events information will be notified as we decided.
| Exhibition | Date | Venue | Exhibits |
|---|---|---|---|
| Held inside NEPCON JAPAN 2013 30th ELECTROTEST JAPAN |
Jan.16-18 Closed. |
Tokyo Big Sight(East Hall), Japan |
Package Probe(Test Socket); BeeContacts J-Contacts J-Contacts K-Series J-Contacts NF-Series Probing Test System; "e5-System" Tester EngineeringTester "μTAT5300-ES" |
| Held inside FINETECH JAPAN TOUCH PANEL JAPAN |
Apr.10-12 Closed. |
Tokyo Big Sight, Japan | Automatically Appearance Inspection System for Touch Panel Mura Solution System Open Repair System Touch Panel Prober Compact Coater for Reserch |
| Exhibition | Date | Venue | Exhibits |
|---|---|---|---|
| BiTS EXPO 2013 (Burn-in & Test Strategies Workshop) |
Mar.3-6 Closed. |
Hilton Phoenix East/Mesa Hotel, AZ, USA |
Package Probe(Test Socket): BeeContacts J-Contacts NF-Series J-Contacts K-Series Probe Card: Probe Card for WLCSP |
| IEEE Semiconductor Wafer Test Workshop (SWTW) 2013 | Jun.9-12 Closed. |
Rancho Bernardo Inn, San Diego, USA |
Advanced Probe Cards; U-Probe "Crescent"/Vertical-Probe(Needle Type)/Probe Card for WLCSP Package Probe; J-Contacts/BeeContacts |