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Event Calender

Japanese Event in 2012

Exhibition Date Venue Exhibits
29th ELECTROTEST JAPAN Jan.18-20
Closed.		 Tokyo Big Sight(East Hall), Japan Package Probe(Test Socket):
 BeeContacts/J-Contacts/J-Contacts K-Series/J-Contacts NF-Series
Probing Test System;
 "e-5 System"/Logic Tester
SEMICON Japan 2012 Dec.5-7
 Makuhari Messe, Chiba, Japan  

International Event in 2012

Exhibition Date Venue Exhibits
BiTS EXPO 2012
(Burn-in & Test Socket Workshop)		 Mar.4-7
 Hilton Phoenix East/Mesa Hotel, Arizona, USA  
IEEE Semiconductor Wafer Test Workshop (SWTW) 2012 Jun.10-13
 Rancho Bernardo Inn, San Diego, USA  

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