Home >> Products >> Technological Column >> Section 9. What is the BIST/DFT Tester?
BIST stands for Built-In Self Test, is one of the DFT: Design For Testability, technologies. In order to reduce the cost of a test, semiconductor manufacturers installed a part of the LSI test feature into LSI chip.
LSI equipped with Circuit, which 'generates testing pattern' and 'verifies test result and expected value.' Advantage and disadvantage of BIST.
Advantages: LSI chip equipped with BIST can reduce the number of test pins, which are necessary for a test, for that reason, the number of the tip simultaneous measuring increases. As a result, it holds down the indispensable LSI tester and can reduce a test cost. Disadvantage: BIST cannot measure the response of the test object circuit directly so it is harder to detect the necessary information for a failure diagnosis.
To raise the reliability of the BIST test result, a failure diagnosis function is added to BIST circuit, and also output the response of the circuit, which is for a failure diagnosis, to an external LSI. That makes it possible to expand the scale of the test circuit.
We offer mTAT for BIST/DFT test. mTAT is consisted with the most suitable hard constitution in accord with devices such as memory BIST, logic BIST and etc and can perform a contact test, an AC parametric test, a DC parametric test, and a function test. We also offer an optimization design according to clients needs and it can produce compactification, Multi-pin (more than 15,000pin) and low-cost.
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