Probe unit is an LCD panel inspection jig customized for a panel size and its resolution. Its role is just like a probe card for semiconductor wafer testing, This unit is configured with probe base functioning as mechanical interface of prober, and probe blocks contacting to LCD panel pads (Refer to figures in below).
Probe block is an aggregation of fine electrical probe and activates an LCD panel by inputting driving signal through probe contact with pad s of LCD driver IC.
MJC has been manufactured and developed 4 types of probe as represented below.
This is a cantilever type probe with molded fixed structure.
This probe is used for TEG inspection of array inspection process and LTPS (low-temperature polysilicon) .
The basic structure is taken over from needle type. Thin Sheeted blade probes are aligned inside slot. This blade is replaceable in units of 1 pin and excellent in terms of maintenance and endurance.
- Fine Blade・SFB・UFB
This basic structure and feature is taken over from blade type and these can support for fine pitch (30um) and multi pin (1,200pin).
This film type probe is manufactured with a photolithographic technology. This probe is used for special pad layout panel (COG panel) required for a high-accuracy and a flexible probe arrangement.
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