Home >> Products >> Technological Column >> Section 10. PV Testing System
Challenge of a thin-film photovoltaic cell is improvement of conversion efficiency and quality stabilization. To achieve high efficiency, high-accuracy characteristics measurement and correct feedback of the results to the manufacturing process are essential. We have developed two kinds of testing systems adapted for inline testing that enable to provide high-accuracy characteristics data at high speed for high-level stabilization of the manufacturing process and contribution to quality improvement of photovoltaic cell panels.
A electrode layer formed on a transparent glass is laser-scribed in the first process of a thin-film photovoltaic cell manufacturing line. The laser scribing process is generally performed with use of plural laser heads to minimize process time, but process failures may occur due to difference among outputs of the laser heads. Also, the electrode layer is required to uniform thickness in order to have a high light-trapping effect as well as high conductivity, which is an original function. Our product, "IR Tester, Model STR-5000," can inspect difference among laser outputs and variation in layer thickness by comparison data of insulation resistance measurement between electrodes after laser scribing.
After formation of a P-I-N layer (structure in which an intrinsic semiconductor (I layer) is put between a p-type semiconductor and an n-type semiconductor), plural cells separated by laser scribing are connected in series. These cells have variation in power generation efficiency due to various reasons, which may influence overall power generation efficiency. Our product, "Dark I-V Tester and Repair System, Model STD-5000," measures leak current of each cell and improve the leak current to an allowable value for efficiency improvement. Since it can also calculate an estimated Pmax (output at a point on a current-voltage characteristic curve where a product of current and voltage is maximum) of each cell, it can provide various information on the layer formation by the value of Pmax distribution and can contribute to high-level stabilization of the manufacturing process required for high efficiency.
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