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What is the LCD panel inspection?

new Full-Automatic Prober Model TP-XG

Fully-Automatic Open-Short/TEG/PIXEL Inspection Prober for 10th generation substrate (3000 x 3300mm).

Adaptable for a wide range of application such as LCD / AMOLED / EPD / Sensor-Panel, etc. based on a-Si TFT/p-Si TFT/IGZO TFT and Organic TFT.

Full-Automatic Prober Model LP-7500/8000 & TP-7500/8500

Full-Automatic Array/Open-Short/TEG/PIXEL Inspection Prober for 7.5th generation substrate(1950 x 2250mm)to 8.5th generation substrate(2200 x 2500mm).

Adaptable for a wide range of application such as LCD / AMOLED / EPD / Sensor-Panel, etc. based on a-Si TFT/p-Si TFT/IGZO TFT and Organic TFT. Maximum 4TEG/4Panel simultaneous measurement/inspection is available.

Full-Automatic Prober Model LP-6000series TP-6000/7000series

Full-Automatic Array/Open-Short/TEG/PIXEL Inspection Prober for 6th generation substrate(1500 x 1850mm)to 7th generation substrate(1870 x 2200mm).

Adaptable for a wide range of application such as LCD / AMOLED / EPD / Sensor-Panel, etc. based on a-Si TFT/p-Si TFT/IGZO TFT and Organic TFT. Maximum 4TEG/4Panel simultaneous measurement/inspection is available.

Full-Automatic Prober Model LP-4800/4850 TP-4800series

Full-Automatic Array/Open-Short/TEG/PIXEL Inspection Prober for 5th generation substrate(1100 x 1300mm)to 5.5th generation substrate(1300 x 1500mm).

Adaptable for a wide range of application such as LCD / AMOLED / EPD / Sensor-Panel, etc. based on a-Si TFT/p-Si TFT/IGZO TFT and Organic TFT. Maximum 4TEG/3Panel simultaneous measurement/inspection is available.

Full-Automatic Prober Model LP-4700series TP-4700series

Full-Automatic Array/Open-Short/TEG/PIXEL Inspection Prober for 4th generation substrate(680 x 880mm)to 4.5th generation substrate(730 x 920mm).

Adaptable for a wide range of application such as LCD / AMOLED / EPD / Sensor-Panel, etc. based on a-Si TFT/p-Si TFT/IGZO TFT and Organic TFT.

Full-Automatic Prober Model LP-4500/LP-4610/LP-4650

Full-Automatic Array/Open-Short/TEG/PIXEL Inspection Prober for 2nd generation substrate(360 x 460mm)to 3.5th generation substrate(600 x 720mm).

LP-4500 was awarded a prize for the great contribution to productivity improvement of TFT/AM-LCD at Advanced Display of the Year 1997.

Semi-Automatic Prober Model LP-400series

Semi-Automatic Array/Open-Short/TEG/PIXEL Inspection Prober for maximum 380 x 480mm substrate in R&D and pilot line uses.

Automatic alignment function is available for achieving fine contact condition. Efficient and best development environment for various up-to-date devices can be offered with variety of optional items such as hot chuck system and laser cutter, etc.

Manual Prober Model 705A-WG7

Manual Array/Open-Short/TEG/PIXEL Inspection Prober for maximum 400 x 400mm devices in R&D use.

Customizations are available to match with customer's special measurement environment and inspection needs with variety of optional items such as hot chuck system and laser cutter, etc.

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