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Semiconductor Testing Products

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Base specification and structurePDF(91KB)

Package Probe(Test Socket)

Test socket for Sn/Matte tin pad
Test socket for Sn/Matte tin pad(Pin type：NF0.5BL-S, NF0.8S, NF1.3S, NF2.5S)
Effect of uniquely designed self cleaning structure;Contamination adhered to pin tip are removed during insertion. Loadboard is protected from contamination by silicone elastomer.
Test socket for NiPdAu pad
Test socket for NiPdAu pad(Pin type：NF0.5BL-L, NF0.8L, NF1.3L, NF2.5L)
Pin life is improved by using Ni material to make contact with the hard pad material. It delivers increased pin life and improved yield while keeping high frequency characteristics.
Kelvin test socket
Kelvin test socket
Suitable for accurate Kelvin measurements. Up to 5A(Continuous current) can be measured. Same performance as other J-contacts, self cleaning structure increases pin life.
DC-40GHz High frequency test socket
DC-40GHz High frequency test socket(Pin type：NF0.5 Compliant Pin)
Compliant pin applicable for LGA and other array type packages. Suitable for high frequency measurement; -1dB@40GHz.
2.45GHz SAW Filter socket
2.45GHz SAW Filter socket
This socket is for exclusive measurement of SAW Filter devices which are commonly used in mobile phone applications. By shortening of the GND path, a highly accurate measurement is enabled.

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