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Prober Accessories Catalog(330KB)

Full Contact Prober Model BP-3000

The concept is to dedicate to 12-inch Full Wafer Contact with featuring Probe Card Auto-Adjust function, referenced mark alignment method and high rigidity stage for stable & reliable probing.

Manual Prober Model MP-30

Manual prober for 12-inch wafer enabling to measure the ultra low current.

TDDB/EM evaluation Prober Model TEP-12A

TDDB/EM evaluation probing station for up to 12-inch wafers. This can measure ultra low current and is adapted to installing Z-axis correction function to avoid needle displacement by heat expansion.

Manual Prober Model MP-10A

Manual Prober capable of handing 8-inch wafers. A semi-automatic wafer loader/unloader and a laser cutter for device cutting are available as options.

Manual Prober Model 708fT/708f

Manual prober for 8-inch wafers enabling to measure fA order ultra low current. 70X series are characterized by compact design having desk-top size. For Model 708fT, thermo-chuck option is available.

Manual Prober for Cu wiring

Manual prober for Cu wired wafers. With use of a special probe card we originally developed, this manual prober achieves an environment in which a Cu wired wafer is not oxidized in a high temperature state. This is a probing system supporting Cu wired waf

Automatic Prober Model SP-80

Semi-auto prober for 8-inch wafers enabling to measure ultra low current. Thermo-chuck option is available.

Fully-automatic Prober Model SP-8000

Automatic prober for 8-inch wafers enabling to measure ultra low current. With shielding chuck applied, low noise less than 10fA is measurable. Thermo-chuck option is available.

Fully-automatic Prober Model SP-8700

Automatic prober for 8-inch wafers enabling to measure ultra low current less than 50fA by using MJC made Ultra low leakage Probe Card.

OPTION

Thermo-Chuck control system(-50degrees - 200degrees)
Hot-Chuck control system(RT - +300degrees)
Laser system
Shield box
Micro manipulators
Coaxial probes
Probes
Cables
Worktable etc...

Probe Card Tester Model PC-763

For High-precision measurement of contact resistance, insulation resistance, planarity and XY coordinates of each probe. PC-763 can measure 2,048 pins.

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