Wafer Prober | MICRONICS JAPAN CO., LTD.

Full Automatic Wafer Prober Model PW-8000

new Full Automatic Wafer Prober Model PW-8000: This system is Automatic Prober for Power Device with maximum 8 inch wafer. It enables high current characteristic test at Wafer process, which was conventionally tested at Package process. It applies for power measurement with maximum 3,000V and 1,200A(Pulse) (when using MJC contactor : HC-04). By our unique new chuck and contactor, it achieves low inductance, low resistance, low R-on measurement with high accuracy and high current characteristic test. Handling system for ultra-thin wafer and TAIKO wafer and temperature controller are available as an option.

new High Current Probe Block Model HC-04: The High Current Probe Block is used for testing high current and high voltage. It is designed as a unique multi contact structure with decreased tolerance. It holds contact temperature constant, and as a result, it achieves longer life, stable contact and lower contact resistance. With single pin replacement, the Probe Block is superior in terms of maintenance over other Probe Blocks.

Semi-automatic Prober Model AP-80

Semi-automatic Prober facilitates to measure Minute Electric current at fA level for 8 inch wafer.
Thermo chuck option is available for high voltage measurement such as MOSFET and IGBT.
*Thermo chuck system provides -50℃ to +200℃.
*Mounted GPIB interface allows controlling AP-80 from exterior and enable to measure automatically.
*Support leading instrument manufacturer's system and software.

Agilent Technologies, Inc.
B1500A Semiconductor Device Analyzer
Desktop EasyEXPERT software
Keithley Instruments, Inc.
System with ACS(measurement soft) and the instrument.
Other instrument, software.

6-inch Manual Prober Model 705B
8-inch Manual Prober Model MP-10A
12-inch Manual Prober Model 705A-WG7: Manual prober for Analysis features Air bearing stage, which makes it easy to operate widely with one hand. Hot-chuck (+40 to +300) and laser cut system are available as option. Enable to customize according to measurement needs and environment. It is broadly used for the newest device tests, such as power device and MEMS.

Auto Prober Model SP-8000: 8inch wafer manual Prober featuring low leakage test, power MOSFET, IGBT and device for high voltage with optional thermo chuck (-50 to +200.) Also offers GPIB interface as a standard feature and enable to measure automatically by external control.

OPTION: Micro manipulator, coaxial probe, Probe needle, coaxial cable.

Temperature controller Model AT-200: With Hot-Chuck, the temperature setting range is from 40℃ to 300℃. Pairing with prober or measuring instrument enable to measure the temperature dependence characteristics of a semiconductor integrated circuit and various electronic devices.

Temperature controller Model AT-300: With Thermo-Chuck , the temperature setting range is from -50℃ to +200℃. Pairing with prober or measuring instrument enable to measure the temperature dependence characteristics of a semiconductor integrated circuit and various electronic devices.