Enable Low Cost with best hardware configuration for device needs such as DFT (BIST integrated device). Enable Low Footprint with All-in-one test head structure adopting high level Integrated packaging of test circuit. Line up engineering testers for development & failure analysis and it contributes to reduce time of device programming and failure analysis on development.
Full Contact Test System
Full Contact Test System provides the solution with combination of Full Wafer Prober, Test System and Full Wafer Probe Card in order to reduce the test cost & enhance productivity. The Concept of development is to pursue the reduction of test system cost, to improve the reliability of testing and to unify pre & after service.